Insulated gate bipolar transistor with epitaxial layer formed on recombination region

In one aspect, a method of fabricating a transistor includes implanting ions into a first portion of a second epitaxial layer to form a recombination region, depositing a second portion of the second epitaxial layer having an n-type dopant on the recombination region, and forming trenches in the sec...

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Bibliographische Detailangaben
1. Verfasser: Hoilien, Noel
Format: Patent
Sprache:eng
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Zusammenfassung:In one aspect, a method of fabricating a transistor includes implanting ions into a first portion of a second epitaxial layer to form a recombination region, depositing a second portion of the second epitaxial layer having an n-type dopant on the recombination region, and forming trenches in the second portion of the second epitaxial layer.