In-field soft magnetic distortion hardware compensation

A method for calibrating a magnetometer of an electronic device can include detecting a change in a magnetism of the electronic device, collecting a first magnetic field data from the magnetometer at sampling frequency of at least 1 hertz, generating an elliptical calibration model based at least pa...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Guichet, Christopher D, Wiens, Alexander J, Beard, Jonathan M, Dervisoglu, Gunes, Wang, Erik L, Howell, Adam S, Balcells, Christopher E, Pham, Hung A, Tan, Tang Y, Bushnell, Tyler S, Lao, Theodore
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for calibrating a magnetometer of an electronic device can include detecting a change in a magnetism of the electronic device, collecting a first magnetic field data from the magnetometer at sampling frequency of at least 1 hertz, generating an elliptical calibration model based at least partially on the collected first magnetic field data, collecting a second magnetic field data from the magnetometer, and fitting the collected second magnetic field data to a sphere using the elliptical calibration model.