Chart erratum and refactoring

Chart erratum and refactoring

A computer-implemented method is provided. The embodiments include evaluating, by one or more processors, a specimen chart relative to a chart erratum model that has features mapped to an optimum state for a first chart type. The method also includes generating a first risk score for a first sample...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Dunne, Jonathan D, Hewitt, Trudy L, Jaiswal, Mayoore Selvarasa, Dana, Saswati, Silverstein, Zachary A
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:A computer-implemented method is provided. The embodiments include evaluating, by one or more processors, a specimen chart relative to a chart erratum model that has features mapped to an optimum state for a first chart type. The method also includes generating a first risk score for a first sample feature of the specimen chart. The first risk score may include a delta from the optimum state. The method also includes refactoring the specimen chart to mitigate the first risk score of the first sample feature.