Apparatus and method for system profile learning in an information handling system

An information handling system includes a processing system including a first sensor, and a second sensor, and a management system including an anomaly table, a learned model table entry associated with the processing system and including a learned model and a first sensor data history, and a predic...

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Bibliographische Detailangaben
Hauptverfasser: Vichare, Nikhil M, Ning, Yan
Format: Patent
Sprache:eng
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Zusammenfassung:An information handling system includes a processing system including a first sensor, and a second sensor, and a management system including an anomaly table, a learned model table entry associated with the processing system and including a learned model and a first sensor data history, and a prediction module to implement a prediction algorithm. The management system is configured to: receive first sensor data and second sensor data, determine an estimate of a first value of the first sensor data using a second value of the second sensor data, determine a residual of the first value by a comparison of the estimate to the first value, determine a significance of the residual, where the significance having a significant value is associated with a predicted anomaly, determine that an anomaly table entry has a known anomaly class for the predicted anomaly, and perform a remediation plan to resolve the predicted anomaly.