Interleaved image capture for dimensioning system
A dimensioning system includes: an emitter assembly to project a planar light beam into a scan volume; first and second image sensors to capture images of overlapping first and second portions of the scan volume; and a controller configured to: in response to an object travelling through the scan vo...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A dimensioning system includes: an emitter assembly to project a planar light beam into a scan volume; first and second image sensors to capture images of overlapping first and second portions of the scan volume; and a controller configured to: in response to an object travelling through the scan volume, for a successive pair of intervals defined by an operational frequency: at a first interval of the pair, (i) control the emitter assembly to project the planar beam and (ii) control the first image sensor to capture a first image of a top and a first side of the object; at a second interval of the pair, (i) control the emitter assembly to project the planar beam and (ii) control the second image sensor to capture a second image of the top and a second side of the object; and generate a three-dimensional image from the first and second images. |
---|