Anti-reflective film

The present invention relates to an anti-reflective film exhibiting one or more peaks (qmax) at a scattering vector of 0.0758 to 0.1256 nm−1, in a graph showing a log value of scattering intensity to a scattering vector defined in small-angle X-ray scattering.

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Bibliographische Detailangaben
Hauptverfasser: Chang, Yeong Rae, Byun, Jin Seok, Jang, Seok Hoon, Lee, Jeong Kyu, Kim, Boo Kyung
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:The present invention relates to an anti-reflective film exhibiting one or more peaks (qmax) at a scattering vector of 0.0758 to 0.1256 nm−1, in a graph showing a log value of scattering intensity to a scattering vector defined in small-angle X-ray scattering.