Computer aided inspection system and methods

Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being in...

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Bibliographische Detailangaben
Hauptverfasser:	Matei, Bogdan C, Oskiper, Taragay, Samarasekera, Supun, Kumar, Rakesh, Salgian, Garbis, Sizintsev, Mikhail
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
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