Computer aided inspection system and methods

Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being in...

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Bibliographische Detailangaben
Hauptverfasser: Matei, Bogdan C, Oskiper, Taragay, Samarasekera, Supun, Kumar, Rakesh, Salgian, Garbis, Sizintsev, Mikhail
Format: Patent
Sprache:eng
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Zusammenfassung:Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being inspected using information obtained from a first sensor package, a model alignment system configured to: use the determined global localization information to index into a corresponding location in a 3D computer model of the structure being inspected; and align observations and/or information obtained from the first sensor package to the local area of the model 3D computer model of the structure extracted; a second sensor package configured to obtain fine level measurements of the structure; and a model recognition system configured to compare the fine level measurements and information obtained about the structure from the second sensor package to the 3D computer model.