Waveform reconstruction in a time-of-flight sensor

A time-of-flight (TOF) sensor device is configured to perform classification analytics on a waveform signal representing a reflected light pulse, and to classify an object from which the light pulse was received based on characteristic properties of the reflected pulse. The TOF sensor device can compare the reflected pulse waveform with stored characteristic waveform profiles indicative of different types of objects or atmospheric particulates, including but not limited to snow, aerosol, water, fog, or mist. Some embodiments of TOF sensor device can also detect excessive levels of mist or suspended particulates that may reduce the detection accuracy of the sensor. To this end, such embodiments project focused light beams according to a defined pattern, and compare the reflected pattern with the defined pattern to determine a degree of pattern distortion attributable to the presence of mist.