Test information management device, test information management method, and non-transitory computer readable storage medium

A test information management device manages test information relating to a test carried out by receiving a test signal output from a first device in a second device. The test information management device includes a linker configured to link together first information including information represen...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Furihata, Ryouhei, Yokota, Yusuke
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A test information management device manages test information relating to a test carried out by receiving a test signal output from a first device in a second device. The test information management device includes a linker configured to link together first information including information representing an output state of the test signal in the first device and second information including image information representing reception results of the test signal in the second device using at least one of identification information for identifying the first device or the second device and times at which the first information and the second information are generated.