Method of manufacturing a semiconductor device and a semiconductor device

A semiconductor device includes a gate structure disposed over a channel region, a source/drain epitaxial layer disposed at a source/drain region, a nitrogen containing layer disposed on the source/drain epitaxial layer, a silicide layer disposed on the nitrogen containing layer, and a conductive co...

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Bibliographische Detailangaben
Hauptverfasser: Lee, Pei-Wei, Fan, Miao-Syuan, Lee, Jung-Wei, Chen, Ming-Te, Lee, Ching-Hua
Format: Patent
Sprache:eng
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Zusammenfassung:A semiconductor device includes a gate structure disposed over a channel region, a source/drain epitaxial layer disposed at a source/drain region, a nitrogen containing layer disposed on the source/drain epitaxial layer, a silicide layer disposed on the nitrogen containing layer, and a conductive contact disposed on the silicide layer.