Systems and methods for determining a thickness of a nonaqueous phase liquid layer

Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density v...

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Bibliographische Detailangaben
Hauptverfasser:	Buckley, Daniel Avery, Koons, Brad William, Gaito, Steven Thomas, Gajjar, Monal
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.