Test system and method for testing a device under test

A test system comprises a device under test and a testing device. The device under test comprises a first initiation unit, wherein the first initiation unit is configured to generate a first wireless initiation signal. The initiation signal consists of at least one of electromagnetic waves and sound...

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Bibliographische Detailangaben
Hauptverfasser: Hettich, Dominik, Guezelarslan, Baris, Karajani, Bledar, Ruttmann, Matthias, Poellmann, Magdalena, Cardalda-Garcia, Adrian, Loupal, Kurt
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A test system comprises a device under test and a testing device. The device under test comprises a first initiation unit, wherein the first initiation unit is configured to generate a first wireless initiation signal. The initiation signal consists of at least one of electromagnetic waves and sound waves, wherein the initiation signal comprises a first test command. The testing device comprises a first sensor unit, wherein the first sensor unit is configured to receive the initiation signal via the first sensor unit. The testing device is configured to generate a first electromagnetic test signal based on the first test command.