System and method for internal structural defect analysis using three-dimensional sensor data

A method for structural analysis of an object includes generating scanned surface data of an object using a three-dimensional sensor and aligning a physical object model corresponding to the scanned surface data with a predetermined three-dimensional model of the object. The method also includes ide...

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Bibliographische Detailangaben
1. Verfasser: Wilsher, Michael J
Format: Patent
Sprache:eng
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Zusammenfassung:A method for structural analysis of an object includes generating scanned surface data of an object using a three-dimensional sensor and aligning a physical object model corresponding to the scanned surface data with a predetermined three-dimensional model of the object. The method also includes identifying an interference between a location of the aligned physical object model, optionally including any elastic deformation with an internal component within the three-dimensional model and generating an indicator of expected damage to the internal component.