Built-in self-test for light emitting diodes

In some examples, a device includes a built-in self-test for detecting a fault between a first light emitting diode (LED) and a second LED. The device includes a first pair of pads configured to connect to the first LED and a second pair of pads configured to connect to the second LED. The built-in...

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Bibliographische Detailangaben
Hauptverfasser:	De Cicco, Adolfo, Chiodo, Rosario
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	In some examples, a device includes a built-in self-test for detecting a fault between a first light emitting diode (LED) and a second LED. The device includes a first pair of pads configured to connect to the first LED and a second pair of pads configured to connect to the second LED. The built-in self-test is configured to control a first driver and a second driver to turn on, one-by-one, respective pass switches connected to the first and second pairs of pads. The built-in self-test is configured to then determine the first and second forward voltages across the first and second LEDs. The built-in self-test can determine whether the fault exists between the first and second LEDs based on the forward voltages.