Managing the determination of a transfer function of a measurement sensor

The present disclosure provides a system and method for the management of a monitor module in an electrical measurement system to determine an estimate of a transfer function of a first measurement sensor in the measurement system. The management comprises outputting a first control instruction for...

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Bibliographische Detailangaben
Hauptverfasser:	Ali Danesh, Seyed Amir, Stuart, John
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure provides a system and method for the management of a monitor module in an electrical measurement system to determine an estimate of a transfer function of a first measurement sensor in the measurement system. The management comprises outputting a first control instruction for instructing the monitor module to determine an estimate of the transfer function of the first measurement sensor over a first individual run length of time, obtaining a first monitor result from the monitor module, the monitor result comprising the estimate of the transfer function of the first measurement sensor and generating a report based at least in part on the first monitor result.