Method of evaluating and visualizing fit of an applicator

A method for evaluating fit of an applicator can include receiving on a process first and second sets of digital data representing the target area and at least a portion of the applicator, respectively, digitally overlying the second set of digital data over the first set of digital data; calculatin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Stanley, Scott Kendyl, Rapach, Andrew Paul, Webbink, Robert
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for evaluating fit of an applicator can include receiving on a process first and second sets of digital data representing the target area and at least a portion of the applicator, respectively, digitally overlying the second set of digital data over the first set of digital data; calculating in the target area at a plurality of points of the overlay a separation distance between the sets of data and generating an electronic image that includes a visual depiction of the calculated separation distance.