Mass spectrometry imaging with automatic parameter varying in ion source to control charged droplet spraying

Mass spectrometry imaging with automatic parameter varying in ion source to control charged droplet spraying

There is provided an apparatus comprising a first ion source (10) arranged and adapted to emit a spray of charged droplets (11), and a control system arranged and adapted to control one or more spatial properties of said spray of charged droplets (11) in use by automatically varying or adjusting one...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hesse, Anthony, Takats, Zoltan, Jones, Emrys, Morris, Mike, O'Brien, Stephen, Pringle, Steven Derek
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:There is provided an apparatus comprising a first ion source (10) arranged and adapted to emit a spray of charged droplets (11), and a control system arranged and adapted to control one or more spatial properties of said spray of charged droplets (11) in use by automatically varying or adjusting one or more parameters of said first ion source.