Etching method

There is provided an etching method which includes: supplying an etching gas to a workpiece including a first SiGe-based material and a second SiGe-based material having different Ge concentrations; and selectively etching the first SiGe-based material and the second SiGe-based material with respect...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Asada, Yasuo, Orii, Takehiko, Takahashi, Nobuhiro
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:There is provided an etching method which includes: supplying an etching gas to a workpiece including a first SiGe-based material and a second SiGe-based material having different Ge concentrations; and selectively etching the first SiGe-based material and the second SiGe-based material with respect to the other using a difference in incubation time until the first SiGe-based material and the second SiGe-based material begin to be etched by the etching gas.