Methods, systems, and computer program product for characterizing an electronic design with a schematic driven extracted view

Disclosed are methods, systems, and articles of manufacture for characterizing an electronic design with a schematic driven extracted view. These techniques identify a schematic of an electronic design, wherein the schematic exists in one or more design fabrics. These techniques further determine an extracted model for characterizing a behavior of the electronic design based at least in part upon the schematic, determine a hierarchical level in a design fabric of the one or more design fabrics of the schematic, and characterize the electronic design with at least an extracted view.