Device and method for calibrating an irradiation system of an apparatus for producing a three-dimensional work piece

A device for calibrating an irradiation system of an apparatus for producing a three-dimensional work piece includes a control unit to control the irradiation system so as to irradiate a radiation beam onto an irradiation plane according to a calibration pattern. The device also includes a sensor ar...

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Bibliographische Detailangaben
Hauptverfasser:	Roesgen, Lukas, Wilkes, Jan
Format:	Patent
Sprache:	eng
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CASTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MAKING METALLIC POWDER MANUFACTURE OF ARTICLES FROM METALLIC POWDER MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PERFORMING OPERATIONS PHYSICS POWDER METALLURGY REGULATING SHAPING CLAY OR OTHER CERAMIC COMPOSITIONS, SLAG, OR MIXTURESCONTAINING CEMENTITIOUS MATERIAL, e.g. PLASTER SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TRANSPORTING WORKING CEMENT, CLAY, OR STONE WORKING METALLIC POWDER WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	A device for calibrating an irradiation system of an apparatus for producing a three-dimensional work piece includes a control unit to control the irradiation system so as to irradiate a radiation beam onto an irradiation plane according to a calibration pattern. The device also includes a sensor arrangement arranged in the irradiation plane to output signals to the control unit in response to being irradiated with the radiation beam according to the calibration pattern. The control unit generates a digital image of an actual irradiation pattern produced by the radiation beam incident on the sensor arrangement based on the signals output by the sensor arrangement, compares the digital image of the actual irradiation pattern with a digital image of a reference pattern so as to determine a deviation between the actual irradiation pattern and the reference pattern, and calibrates the irradiation system based on the determined deviation between the actual irradiation pattern and the reference pattern.