System and method for decoder assisted dynamic log-likelihood ratio (LLR) estimation for NAND flash memories

A flash memory system may include a flash memory and a circuit for performing operations of the flash memory. The circuit may be configured to estimate slope information of a plurality of threshold voltage samples based on soft decoding errors in connection with a first read operation on the flash m...

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Sprache:eng
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Zusammenfassung:A flash memory system may include a flash memory and a circuit for performing operations of the flash memory. The circuit may be configured to estimate slope information of a plurality of threshold voltage samples based on soft decoding errors in connection with a first read operation on the flash memory. The circuit may be further configured to generate estimated soft information based on the estimated slope information. The circuit may be further configured to decode a result of a second read operation on the flash memory based on the estimated soft information.