System and method for modeling and correcting frequency of quartz crystal oscillator

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a produ...

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Bibliographische Detailangaben
Hauptverfasser:	Li, Kuangmin, Babitch, Daniel
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES BASIC ELECTRONIC CIRCUITRY DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ELECTRICITY LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.