Alignment of images of a calibration image using a pattern

In an example, two images of a printed calibration image are acquired using two measurement devices. The measurement devices are offset along an axis so that the two images correspond to two portions of the printed calibration image overlapping along the axis. The printed calibration image comprises...

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Bibliographische Detailangaben
Hauptverfasser: Kaminsky, Eli, Haim, Moshe, Yedid Am, Tsafrir
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In an example, two images of a printed calibration image are acquired using two measurement devices. The measurement devices are offset along an axis so that the two images correspond to two portions of the printed calibration image overlapping along the axis. The printed calibration image comprises a pattern extending across the printed calibration image in the direction of the axis, the pattern defining a shape so that in each image, a portion of the pattern appears as different from a straight line parallel to the axis. The two images are aligned using the two portions of pattern.