Debris-removal groove for CMP polishing pad

The invention provides a polishing pad suitable for polishing or planarizing at least one of semiconductor, optical and magnetic substrates. The polishing pad includes a polishing layer having a polymeric matrix, a thickness and a polishing track representing a working region of the polishing layer...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Connell, Patricia, Cook, Lee Melbourne, Tong, Yuhua, So, Joseph, Hendron, Jeffrey James
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:The invention provides a polishing pad suitable for polishing or planarizing at least one of semiconductor, optical and magnetic substrates. The polishing pad includes a polishing layer having a polymeric matrix, a thickness and a polishing track representing a working region of the polishing layer for polishing or planarizing. Radial drainage grooves extend through the polishing track facilitate polishing debris removal through the polishing track and underneath the at least one of semiconductor, optical and magnetic substrates and then beyond the polishing track toward the perimeter of the polishing pad during rotation of the polishing pad.