Method and optical system for saturated illumination of analytes by a number of beams

Method and optical system for saturated illumination of analytes by a number of beams

A method of configuring an optical system to reduce variations in measured properties of an analyte includes selecting a number of beams into which radiation from a source of radiation is to be split, wherein, upon irradiating the analyte from a plurality of directions by the number of beams, a vari...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Myers, John Patrick, Marks, Randall, Lao, Edward, Luscher, Mark
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method of configuring an optical system to reduce variations in measured properties of an analyte includes selecting a number of beams into which radiation from a source of radiation is to be split, wherein, upon irradiating the analyte from a plurality of directions by the number of beams, a variation of a resulting measurement of the analyte is at or below a threshold. The method further includes aligning the source of radiation and a plurality of optical elements optically coupled to the source of radiation such that the selected number of beams irradiate the analyte upon emission of radiation by the source of radiation.