Global positioning of a sensor with respect to different tiles for a global three-dimensional surface reconstruction

A measuring system can three-dimensionally reconstruct surface geometry of an object by, from a first pose with a sensor, generating a first three-dimensional representation of a first portion of the object, and with a first camera, generating a first image covering at least part of the first portio...

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Bibliographische Detailangaben
1. Verfasser:	Tsuk, Nir
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
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Beschreibung
Zusammenfassung:	A measuring system can three-dimensionally reconstruct surface geometry of an object by, from a first pose with a sensor, generating a first three-dimensional representation of a first portion of the object, and with a first camera, generating a first image covering at least part of the first portion, and from a second pose with the sensor, generating a second three-dimensional representation of a second portion of the object, and with the first camera, generating a second image covering at least part of the second portion. A stationary first projector can be arranged externally configured for projecting a texture onto both first and second portions of the object. A stitching computer can be configured for generating a unitary three-dimensional representation of both the first and second portions of the object from the first and second three-dimensional representations based on the first and second images.