Pairwise ansatz for quantum process tomography

A method for characterizing an N-qubit process, for N an integer greater than 1. In some embodiments, the method includes performing a plurality of characterization measurements of the N-qubit process to form a plurality of process maps, and fitting the plurality of process maps with a composition o...

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Bibliographische Detailangaben
Hauptverfasser:	Govia, Luke Colin Gene, Krovi, Hari Kiran
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS PULSE TECHNIQUE
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Beschreibung
Zusammenfassung:	A method for characterizing an N-qubit process, for N an integer greater than 1. In some embodiments, the method includes performing a plurality of characterization measurements of the N-qubit process to form a plurality of process maps, and fitting the plurality of process maps with a composition of K-qubit processes, K being an integer greater than 1 and less than N.