Backside contact to a final substrate

A method for fabricating a backside contact using a silicon-on-insulator substrate that includes a device layer, a buried insulator layer, and a handle wafer. The method includes forming a first switch and a second switch in the device layer. A trench that extends through the device layer and partia...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Stamper, Anthony K, Gambino, Jeffrey P, Shank, Steven M, Jaffe, Mark D
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A method for fabricating a backside contact using a silicon-on-insulator substrate that includes a device layer, a buried insulator layer, and a handle wafer. The method includes forming a first switch and a second switch in the device layer. A trench that extends through the device layer and partially through the buried insulator layer is formed. An electrically-conducting connection is formed in the trench.