Information handling system and method to dynamically detect and recover from thermally induced memory failures

Embodiments of information handling systems (IHSs) and methods are provided herein to dynamically detect and recover from thermally induced memory failures. Some embodiments include receiving an interrupt corresponding to a memory failure, detecting a current temperature of one or more memory components, and performing a series of memory tests on a specific block of memory within the memory components if the current temperature exceeds a maximum operating temperature specified for the memory components. Some embodiments include storing original contents of the specific block of memory within another memory component of the IHS, performing a first memory test on the specific block of memory at the current temperature, subsequently performing a second memory test on the specific block of memory at a temperature significantly lower than the current temperature, and determining that the memory failure is a thermally induced memory failure if the first memory test fails and the second memory test passes.