Free space segment tester (FSST)

Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. T...

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Bibliographische Detailangaben
Hauptverfasser:	Ceesay, Lamin, Sazegar, Mohsen, Ash, Benjamin, Hower, Tom, Fornes, Matthew, Pedler, William, Repp, Jacob Tyler
Format:	Patent
Sprache:	eng
Schlagworte:	ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment. In one example, the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable.