System and method for high speed surface and subsurface FOD and defect detection

A system and method for the detection of foreign object debris materials or defects on and/or under a surface of a composite part under manufacture. A member, for example an inspection gantry, is configured to move over the surface. A thermal excitation source is fixed to the member and is configure...

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Bibliographische Detailangaben
Hauptverfasser:	Thompson, Jeffrey G, Safai, Morteza
Format:	Patent
Sprache:	eng
Schlagworte:	AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CALCULATING COLORIMETRY COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PERFORMING OPERATIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRESENTATION OF DATA RADIATION PYROMETRY RECOGNITION OF DATA RECORD CARRIERS SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TESTING TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	A system and method for the detection of foreign object debris materials or defects on and/or under a surface of a composite part under manufacture. A member, for example an inspection gantry, is configured to move over the surface. A thermal excitation source is fixed to the member and is configured to direct infrared radiation across the surface. An infrared camera is also fixed to the member a predetermined distance away from the thermal excitation source and is configured to scan the surface as the member moves over the surface to detect and output scan information of the surface. A controller is coupled to the excitation source and to the infrared camera. The controller is configured to process the scan information from the infrared camera to identify a foreign object debris material or defect located on and/or under the surface.