High input impedance electro-optic sensor

The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.