Graphic overlay for measuring dimensions of features using a video inspection device

Methods and devices are provided for providing a graphic overlay for measuring dimensions of features using a video inspection device. One or more measurement cursors are placed on pixels of an image of the object. One or more planes are determined parallel or normal to a reference surface or line a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	Bendall, Clark Alexander
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Methods and devices are provided for providing a graphic overlay for measuring dimensions of features using a video inspection device. One or more measurement cursors are placed on pixels of an image of the object. One or more planes are determined parallel or normal to a reference surface or line and passing through surface points associated with the measurement cursors. A semi-transparent graphic overlay is placed on pixels with associated surface points having three-dimensional surface coordinates less than a predetermined distance from the plane(s) to help the user place the measurement cursors.