Three-dimensional integrated circuit structure and method of manufacturing the same

Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.

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Bibliographische Detailangaben
Hauptverfasser: Chen, Yi-Hsiu, Ko, Jia-Ling, Liao, Ebin, Chiou, Wen-Chih, Shih, Hong-Ye
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.