Metrology apparatus to facilitate capture of metrology data

In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate ha...

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Bibliographische Detailangaben
1. Verfasser:	Rawas, Oussama
Format:	Patent
Sprache:	eng
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BLASTING ENGINEERING ELEMENTS AND UNITS FRAMES, CASINGS, OR BEDS OF ENGINES OR OTHER MACHINES ORAPPARATUS NOT SPECIFIC TO AN ENGINE, MACHINE, OR APPARATUSPROVIDED FOR ELSEWHERE GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVEFUNCTIONING OF MACHINES OR INSTALLATIONS HEATING LIGHTING MEANS FOR DAMPING VIBRATION MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MECHANICAL ENGINEERING PERFORMING OPERATIONS PHYSICS SHOCK-ABSORBERS SPRINGS STANDS OR SUPPORTS TARIFF METERING APPARATUS TESTING THERMAL INSULATION IN GENERAL TRANSPORTING WEAPONS
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Beschreibung
Zusammenfassung:	In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate having a top surface and a bottom surface, and the base plate may include a plurality of holes from the top surface to the bottom surface. The metrology apparatus may further include a plurality of suspension rods, and a distal end of a respective suspension rod may be positioned through a respective hole such that a first portion of the distal end is disposed on the top surface of the base plate and a second portion of the distal end is disposed on the bottom surface of the base plate. The metrology device may be connected to the bottom surface of the base plate such that at least a portion of an assembly cell is within a field of view of the metrology device.