Input/output terminal characteristic calibration circuit and semiconductor apparatus including the same

An input/output terminal characteristic calibration circuit may include a plurality of input/output terminals a subset of which is configured to partially and selectively receive a characteristic calibration signal according to an external input, such that characteristics of the input/output terminals corresponding to the characteristic calibration signal are calibrated. The input/output terminal characteristic calibration circuit may also include a characteristic calibration signal generation circuit coupled to the plurality of input/output terminals in common through a test signal line, and configured to provide the characteristic calibration signal to the plurality of input/output terminals in common through the test signal line.