Temperature sensing based flow monitoring and fault detection

An apparatus is provided which comprises: a first circuitry to receive a measurement of a first temperature of a section of a computing device during a first loading condition of the computing device, and to receive a measurement of a second temperature of the section of the computing device during...

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Bibliographische Detailangaben
Hauptverfasser: Jurski, Janusz P, Nagappan, Ramkumar, Krishnan, Shankar, Sawicki, Piotr, Bandorawalla, Tozer J, Oriol, Mariusz, Steinbrecher, Robin A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An apparatus is provided which comprises: a first circuitry to receive a measurement of a first temperature of a section of a computing device during a first loading condition of the computing device, and to receive a measurement of a second temperature of the section of the computing device during a second loading condition of the computing device; and a second circuitry to detect a potential fault in a cooling system to cool the computing device, based at least in part on the first temperature and the second temperature.