System and method for analyzing a device
A system and method for analyzing a device are disclosed. In an aspect, a method can comprise determining a parameter of a device at a kernel level of a software stack associated with the device, analyzing the parameter to determine an event state, comparing the event state to a white list to determ...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A system and method for analyzing a device are disclosed. In an aspect, a method can comprise determining a parameter of a device at a kernel level of a software stack associated with the device, analyzing the parameter to determine an event state, comparing the event state to a white list to determine a state of an alert trigger, and generating an alert in response to the determined state of the alert trigger. |
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