Test apparatus for semiconductor device and method of manufacturing semiconductor device

Provided are a test board and a test system for efficiently testing a semiconductor package, and a manufacturing method for the semiconductor package using the same. A test apparatus includes a field programmable gate array (FPGA) configured to output a first data signal to be transmitted to the sem...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Yu, Byeong-min, Yun, Joo-sung, Kwon, Soon-il
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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