Test apparatus for semiconductor device and method of manufacturing semiconductor device

Provided are a test board and a test system for efficiently testing a semiconductor package, and a manufacturing method for the semiconductor package using the same. A test apparatus includes a field programmable gate array (FPGA) configured to output a first data signal to be transmitted to the semiconductor device and a second data signal to be transmitted to the semiconductor device and a memory configured to store a test result. The FPGA includes a first input/output block configured to output the first data signal, a second input/output block configured to output the second data signal, a serializer/deserializer (SerDes) circuit configured to generate a strobe signal, and a skew calibration input/output block configured to receive the first data signal from the first input/output block, the second data signal from the second input/output block, and the strobe signal from the SerDes circuit.