Systems and methods for region-adaptive defect detection

A defect detection method includes acquiring a reference image; selecting a target region of the reference image; identifying, based on a matching metric, one or more comparative regions of the reference image corresponding to the target region; acquiring a test image; masking the test image with th...

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Bibliographische Detailangaben
Hauptverfasser: Ramachandran, Vijayakumar, Brauer, Bjorn, Karsenti, Laurent, Maher, Christopher, Rosengaus, Eliezer, Miller, Roni, Jordan, III, John R
Format: Patent
Sprache:eng
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Zusammenfassung:A defect detection method includes acquiring a reference image; selecting a target region of the reference image; identifying, based on a matching metric, one or more comparative regions of the reference image corresponding to the target region; acquiring a test image; masking the test image with the target region of the reference image and the one or more comparative regions of the reference image; defining a defect threshold for the target region in the test image based on the one or more comparative regions in the test image; and determining whether the target region of the test image contains a defect based on the defect threshold.