Charged particle radiation measuring method and charged particle radiation measuring device

Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kada, Wataru, Hanaizumi, Osamu, Kamiya, Tomihiro, Satoh, Takahiro, Miura, Kenta, Susaki, Junichi, Yamada, Suzuya
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Kada, Wataru
Hanaizumi, Osamu
Kamiya, Tomihiro
Satoh, Takahiro
Miura, Kenta
Susaki, Junichi
Yamada, Suzuya
description Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10533130B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10533130B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10533130B23</originalsourceid><addsrcrecordid>eNrjZIh2zkgsSk9NUShILCrJTM5JVShKTMlMLMnMz1PITU0sLi3KzEsHskoy8lMUEvNSFJKJUZ-SWpaZnMrDwJqWmFOcyguluRkU3VxDnD10Uwvy41OLCxKTU_NSS-JDgw0NTI2NDY0NnIyMiVEDAKBlO-o</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Charged particle radiation measuring method and charged particle radiation measuring device</title><source>esp@cenet</source><creator>Kada, Wataru ; Hanaizumi, Osamu ; Kamiya, Tomihiro ; Satoh, Takahiro ; Miura, Kenta ; Susaki, Junichi ; Yamada, Suzuya</creator><creatorcontrib>Kada, Wataru ; Hanaizumi, Osamu ; Kamiya, Tomihiro ; Satoh, Takahiro ; Miura, Kenta ; Susaki, Junichi ; Yamada, Suzuya</creatorcontrib><description>Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.</description><language>eng</language><subject>ADHESIVES ; CHEMISTRY ; DYES ; MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; PAINTS ; PHYSICS ; POLISHES ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200114&amp;DB=EPODOC&amp;CC=US&amp;NR=10533130B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200114&amp;DB=EPODOC&amp;CC=US&amp;NR=10533130B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kada, Wataru</creatorcontrib><creatorcontrib>Hanaizumi, Osamu</creatorcontrib><creatorcontrib>Kamiya, Tomihiro</creatorcontrib><creatorcontrib>Satoh, Takahiro</creatorcontrib><creatorcontrib>Miura, Kenta</creatorcontrib><creatorcontrib>Susaki, Junichi</creatorcontrib><creatorcontrib>Yamada, Suzuya</creatorcontrib><title>Charged particle radiation measuring method and charged particle radiation measuring device</title><description>Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.</description><subject>ADHESIVES</subject><subject>CHEMISTRY</subject><subject>DYES</subject><subject>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>PAINTS</subject><subject>PHYSICS</subject><subject>POLISHES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIh2zkgsSk9NUShILCrJTM5JVShKTMlMLMnMz1PITU0sLi3KzEsHskoy8lMUEvNSFJKJUZ-SWpaZnMrDwJqWmFOcyguluRkU3VxDnD10Uwvy41OLCxKTU_NSS-JDgw0NTI2NDY0NnIyMiVEDAKBlO-o</recordid><startdate>20200114</startdate><enddate>20200114</enddate><creator>Kada, Wataru</creator><creator>Hanaizumi, Osamu</creator><creator>Kamiya, Tomihiro</creator><creator>Satoh, Takahiro</creator><creator>Miura, Kenta</creator><creator>Susaki, Junichi</creator><creator>Yamada, Suzuya</creator><scope>EVB</scope></search><sort><creationdate>20200114</creationdate><title>Charged particle radiation measuring method and charged particle radiation measuring device</title><author>Kada, Wataru ; Hanaizumi, Osamu ; Kamiya, Tomihiro ; Satoh, Takahiro ; Miura, Kenta ; Susaki, Junichi ; Yamada, Suzuya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10533130B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>ADHESIVES</topic><topic>CHEMISTRY</topic><topic>DYES</topic><topic>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>PAINTS</topic><topic>PHYSICS</topic><topic>POLISHES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Kada, Wataru</creatorcontrib><creatorcontrib>Hanaizumi, Osamu</creatorcontrib><creatorcontrib>Kamiya, Tomihiro</creatorcontrib><creatorcontrib>Satoh, Takahiro</creatorcontrib><creatorcontrib>Miura, Kenta</creatorcontrib><creatorcontrib>Susaki, Junichi</creatorcontrib><creatorcontrib>Yamada, Suzuya</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kada, Wataru</au><au>Hanaizumi, Osamu</au><au>Kamiya, Tomihiro</au><au>Satoh, Takahiro</au><au>Miura, Kenta</au><au>Susaki, Junichi</au><au>Yamada, Suzuya</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Charged particle radiation measuring method and charged particle radiation measuring device</title><date>2020-01-14</date><risdate>2020</risdate><abstract>Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US10533130B2
source esp@cenet
subjects ADHESIVES
CHEMISTRY
DYES
MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
PAINTS
PHYSICS
POLISHES
TESTING
title Charged particle radiation measuring method and charged particle radiation measuring device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T10%3A09%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kada,%20Wataru&rft.date=2020-01-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10533130B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true