Charged particle radiation measuring method and charged particle radiation measuring device

Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.

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Bibliographische Detailangaben
Hauptverfasser:	Kada, Wataru, Hanaizumi, Osamu, Kamiya, Tomihiro, Satoh, Takahiro, Miura, Kenta, Susaki, Junichi, Yamada, Suzuya
Format:	Patent
Sprache:	eng
Schlagworte:	ADHESIVES CHEMISTRY DYES MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING METALLURGY MISCELLANEOUS APPLICATIONS OF MATERIALS MISCELLANEOUS COMPOSITIONS NATURAL RESINS PAINTS PHYSICS POLISHES TESTING
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Beschreibung
Zusammenfassung:	Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.