Methods and systems for characterizing a surface of a structural component
A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target locate...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Valenzuela, Dario I |
| description | A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target located at a third position on an outer ring, and (iv) the component target; projecting a second reference image onto a second surface region; capturing a second pair of images that both include (i) the second reference image, (ii) a second ring target located at a second position on the inner ring, and (iii) a fourth ring target located at a fourth position on the outer ring; and based on the first pair of images and the second pair of images, generating coordinate data that defines the first surface region and the second surface region within a coordinate space. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US10488185B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US10488185B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US10488185B13</originalsourceid><addsrcrecordid>eNrjZPDyTS3JyE8pVkjMS1EoriwuSc0tVkjLL1JIzkgsSkwuSS3KrMrMS1dIVCguLUpLTE5VyE8DcUqKSpNLSosScxSS83ML8vNS80p4GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcQFQc15qSXxosKGBiYWFoYWpk6ExMWoAQDE1iQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and systems for characterizing a surface of a structural component</title><source>esp@cenet</source><creator>Valenzuela, Dario I</creator><creatorcontrib>Valenzuela, Dario I</creatorcontrib><description>A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target located at a third position on an outer ring, and (iv) the component target; projecting a second reference image onto a second surface region; capturing a second pair of images that both include (i) the second reference image, (ii) a second ring target located at a second position on the inner ring, and (iii) a fourth ring target located at a fourth position on the outer ring; and based on the first pair of images and the second pair of images, generating coordinate data that defines the first surface region and the second surface region within a coordinate space.</description><language>eng</language><subject>AEROPLANES ; AIRCRAFT ; AVIATION ; CALCULATING ; COMPUTING ; COSMONAUTICS ; COUNTING ; HELICOPTERS ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PERFORMING OPERATIONS ; PHYSICS ; TESTING ; TRANSPORTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191126&DB=EPODOC&CC=US&NR=10488185B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191126&DB=EPODOC&CC=US&NR=10488185B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Valenzuela, Dario I</creatorcontrib><title>Methods and systems for characterizing a surface of a structural component</title><description>A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target located at a third position on an outer ring, and (iv) the component target; projecting a second reference image onto a second surface region; capturing a second pair of images that both include (i) the second reference image, (ii) a second ring target located at a second position on the inner ring, and (iii) a fourth ring target located at a fourth position on the outer ring; and based on the first pair of images and the second pair of images, generating coordinate data that defines the first surface region and the second surface region within a coordinate space.</description><subject>AEROPLANES</subject><subject>AIRCRAFT</subject><subject>AVIATION</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COSMONAUTICS</subject><subject>COUNTING</subject><subject>HELICOPTERS</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDyTS3JyE8pVkjMS1EoriwuSc0tVkjLL1JIzkgsSkwuSS3KrMrMS1dIVCguLUpLTE5VyE8DcUqKSpNLSosScxSS83ML8vNS80p4GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcQFQc15qSXxosKGBiYWFoYWpk6ExMWoAQDE1iQ</recordid><startdate>20191126</startdate><enddate>20191126</enddate><creator>Valenzuela, Dario I</creator><scope>EVB</scope></search><sort><creationdate>20191126</creationdate><title>Methods and systems for characterizing a surface of a structural component</title><author>Valenzuela, Dario I</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US10488185B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>AEROPLANES</topic><topic>AIRCRAFT</topic><topic>AVIATION</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COSMONAUTICS</topic><topic>COUNTING</topic><topic>HELICOPTERS</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Valenzuela, Dario I</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Valenzuela, Dario I</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and systems for characterizing a surface of a structural component</title><date>2019-11-26</date><risdate>2019</risdate><abstract>A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target located at a third position on an outer ring, and (iv) the component target; projecting a second reference image onto a second surface region; capturing a second pair of images that both include (i) the second reference image, (ii) a second ring target located at a second position on the inner ring, and (iii) a fourth ring target located at a fourth position on the outer ring; and based on the first pair of images and the second pair of images, generating coordinate data that defines the first surface region and the second surface region within a coordinate space.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US10488185B1 |
| source | esp@cenet |
| subjects | AEROPLANES AIRCRAFT AVIATION CALCULATING COMPUTING COSMONAUTICS COUNTING HELICOPTERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PERFORMING OPERATIONS PHYSICS TESTING TRANSPORTING |
| title | Methods and systems for characterizing a surface of a structural component |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T00%3A09%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Valenzuela,%20Dario%20I&rft.date=2019-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS10488185B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |