Methods and systems for characterizing a surface of a structural component

A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target locate...

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1. Verfasser: Valenzuela, Dario I
Format: Patent
Sprache:eng
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Zusammenfassung:A method includes projecting a first reference image onto a first surface region that includes a component target; capturing a first pair of images that both include (i) the first reference image, (ii) a first ring target located at a first position on an inner ring, (iii) a third ring target located at a third position on an outer ring, and (iv) the component target; projecting a second reference image onto a second surface region; capturing a second pair of images that both include (i) the second reference image, (ii) a second ring target located at a second position on the inner ring, and (iii) a fourth ring target located at a fourth position on the outer ring; and based on the first pair of images and the second pair of images, generating coordinate data that defines the first surface region and the second surface region within a coordinate space.