Method of planarizing a semiconductor wafer and semiconductor wafer

Various embodiments provide a method of planarizing a semiconductor wafer, wherein the method comprises providing a semiconductor wafer comprising a surface; and forming a mask layer on the surface of the semiconductor wafer, wherein a thickness of the mask layer is smaller in thinning areas, which...

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Bibliographische Detailangaben
Hauptverfasser: Riegler, Andreas, Von Koblinski, Carsten, Ottowitz, Markus
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Various embodiments provide a method of planarizing a semiconductor wafer, wherein the method comprises providing a semiconductor wafer comprising a surface; and forming a mask layer on the surface of the semiconductor wafer, wherein a thickness of the mask layer is smaller in thinning areas, which are to be thinned for planarizing, than in areas which are not to be thinned for planarizing.