Automated data overlay in industrial monitoring systems

Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include m...

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Bibliographische Detailangaben
1. Verfasser:	Williams, Scott Terrell
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING
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Beschreibung
Zusammenfassung:	Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second plot. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.