Automatically generated test diagram

A method of operating a data processing system to generate a diagram indicative of an experimental setup includes a device to be tested (DUT) and a plurality of test instruments is disclosed. The method includes detecting a first test instrument that is connected to the data processing system and determining connection points to the first test instrument. A script that specifies tests for the DUT using the plurality of test instruments and includes instructions specifying measurements to be made by the first test instrument is examined. A first connection between the DUT and the first test instrument is determined. An initial diagram on a display controlled by the data processing system is generated. The initial diagram includes a first node representing the first test instrument, a second node representing the DUT and a line representing the first connection between the first and second nodes.