Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system

Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system

A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltag...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Peschke, Martin
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.